Two Novel X-ray Optical Schemes for Spectroscopy with Fast Time Resolution and Two-dimensional Imaging with High Magnification

Description:

A Novel X-ray Optical Scheme for Spectroscopy with Fast Time Resolution and High Spectral Resolution Simultaneously

Princeton Docket # 12-2779-1

Researchers at the Princeton Plasma Physics Laboratory at Princeton University have developed a novel x-ray optical scheme for spectroscopy with fast time and high spectral resolution.

The technology makes use of one  convex and one concave spherically bent crystal to image the radiation emitted from high-density, laser-produced plasmas. Significantly, this scheme provides simultaneously high time resolution as well as high spectral resolution.  Additionally, it allows for a remote observation of a source of radiation or an object when it is in an inaccessible or hostile environment. The technology could also be used with a broad spectrum of electromagnetic radiation, including  microwaves, visible light, and x-rays.

It is anticipated that this novel x-ray optical scheme will have immediate application for the x-ray diagnosis of high-density plasmas. Because of the fast time resolution and the high spectral resolution, it would be a  significant improvement over  the existing pinhole cameras currently used for this application. Additionally, the technology could be employed in other applications such as EUV lithography, for two-dimensional x-ray imaging of tumors, in chemical research, or in industrial manufacturing, wherever stigmatic imaging with large magnification and at large angles of incidence is required, in a potentially harsh environment.

 

The U.S. Department of Energy's Princeton Plasma Physics Laboratory is a Collaborative National Center for plasma and fusion science. Its primary mission is to develop the scientific understanding and the key innovations which will lead to an attractive fusion energy source. Associated missions include conducting world-class research along the broad frontier of plasma science and providing the highest quality of scientific education. 

 

Intellectual Property status

Patent protection is pending.

 

A Novel X-ray Optical Scheme for Two-dimensional Imaging with High Magnification

Princeton Docket # 12-2779-2

Researchers at the Princeton Plasma Physics Laboratory at Princeton University have developed a novel x-ray optical scheme for two-dimensional imaging with high magnification.

This novel scheme was developed for the spectroscopy of high density, laser produced plasmas and was designed to obtain fast (sub-ns) time resolution and high spectral resolution.  It has the function of a microscope but allows for a remote observation of a source of radiation or an object when it is in an inaccessible environment. The technology makes use of a convex spherically bent crystal to image the radiation emitted from a high density laser produced plasma of small dimensions (a point source), as lines across the strips of a gated multichannel strip detector.  The strips are activated sequentially to obtain sub-ns time resolution.  Different wavelengths are imaged as different lines across the detector, so that this technology provides simultaneously high time resolution as well as high spectral resolution.   

This scheme is simple, inexpensive and can be easily implemented for the remote observation of a radiation source or object.  .  Additionally, it can also work across a broad spectrum of electromagnetic radiation including microwaves, visible light, and x-rays.  Currently there is no other system with these capabilities on the market.

 

The U.S. Department of Energy's Princeton Plasma Physics Laboratory is a Collaborative National Center for plasma and fusion science. Its primary mission is to develop the scientific understanding and the key innovations which will lead to an attractive fusion energy source. Associated missions include conducting world-class research along the broad frontier of plasma science and providing the highest quality of scientific education. 

 

Intellectual Property status

Patent protection is pending.

Contact

 

Micheal Tyerech

Princeton University Office of Technology Licensing 

(609) 258-6762 tyerech@princeton.edu

Patent Information:
For Information, Contact:
Michael Tyerech
former Princeton Sr. Licensing Associate
Princeton University
mtyerech@rd.us.loreal.com
Inventors:
Manfred Bitter
Kenneth Hill
Luis DelgadO-Aparicio
Novimir Pablant
Steven Scott
Frank Jones
Keywords:
Imaging
Opto-Electronics/ELE ENG