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Princeton
University Invention # 09-2523
Quantum
Cascade (QC) wafer quality testing requires intensive processing and
characterization. Conventional techniques used for wafer quality testing include
photoluminescence, x-ray diffraction, Hall effect measurements, high resolution
x-ray diffraction, transmission electron microscopy and secondary...
Published: 3/15/2018
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Inventor(s): Claire Gmachl, Ekua Bentil
Keywords(s):
Category(s): Opto-Electronics/ Electrical Engineering
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